Maximum Sample Size: 20×20 cm2
All types of semiconductors and solar cells
Hyperspectral imaging allows for measuring light emission properties on each point of a material placed under managed excitation conditions. Ultrafast imaging by streak cameras.
At IPVF, we manage numerical models that will allow in depth understanding of luminescence levels and spectra obtained on each point of the material surface. This gives previous information on defect types, loss mechanisms and many more physical phenomena at stake. A precious know-how when struggling with theoretical efficiency limits predicted by physics.
Defect luminescence, thermalization effects…
We have 3 different setups at IPVF that will allow to probe samples from small soze (few mm²) up to modules.
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