Screen Printer – ASYS EKRA

Fabrication / Integration

Processing

Mechanical Scribing – CIELLE

Fabrication / Integration

Processing

Profilometer – BRUKER

Characterization

Compo/Morpho

Confocal Microscopy – OLYMPUS

Characterization

Compo/Morpho

Evaporator – PLASSYS

Processing

Vacuum-based

MBE – RIBER

Processing

Vacuum-based

Sputtering – PLASSYS

Processing

Vacuum-based

Co-Evaporation – MBE KOMPONENTEN

Processing

Vacuum-based

IQE – NEWPORT

Characterization

Opto-Electronic

Solar Simulator – NEWPORT

Characterization

Opto-Electronic

Spectroscopy UV/Vis/NIR – AGILENT

Opto-Electronic

AFM / KPFM / Resiscope Setup

Characterization

Compo/Morpho

XRF – FISCHER

Characterization

Compo/Morpho

SEM – ZEISS

Characterization

Compo/Morpho

XRD – PANALYTICAL

Characterization

Compo/Morpho

GD-OES – HORIBA

Characterization

Compo/Morpho

XPS – THERMOSCIENTIFIC

Characterization

Compo/Morpho

Raman – HORIBA

Characterization

Compo/Morpho

Laser Scribing – INNOLAS

Fabrication / Integration

Processing

ALD

Processing

Vacuum-based